Study of an inclined, segmented cantilever with tip load

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Study of the flexural sensitivity and resonant frequency of an inclined AFM cantilever with sidewall probe

The resonant frequency and sensitivity of an atomic force microscope (AFM) cantilever with assembled cantilever probe (ACP) have been analyzed and a closed-form expression for the sensitivity of vibration modes has been obtained. The proposed ACP comprises an inclined cantilever and extension, and a tip located at the free end of the extension, which makes the AFM capable of topography at sidew...

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Study of the flexural sensitivity and resonant frequency of an inclined AFM cantilever with sidewall probe

The resonant frequency and sensitivity of an atomic force microscope (AFM) cantilever with assembled cantilever probe (ACP) have been analyzed and a closed-form expression for the sensitivity of vibration modes has been obtained. The proposed ACP comprises an inclined cantilever and extension, and a tip located at the free end of the extension, which makes the AFM capable of topography at sidew...

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study of the flexural sensitivity and resonant frequency of an inclined afm cantilever with sidewall probe

the resonant frequency and sensitivity of an atomic force microscope (afm) cantilever with assembled cantilever probe (acp) have been analyzed and a closed-form expression for the sensitivity of vibration modes has been obtained. the proposed acp comprises an inclined cantilever and extension, and a tip located at the free end of the extension, which makes the afm capable of topography at sidew...

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ژورنال

عنوان ژورنال: Quarterly of Applied Mathematics

سال: 1995

ISSN: 0033-569X,1552-4485

DOI: 10.1090/qam/1315449